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QUAD News The ASTER Technologies Newsletter |
May 2008 Volume 4 Issue 1 |
Inside this issue...
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New test coverage loaders added to the TestWay portfolio | |
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ASTER has added new coverage loaders for the TRI in-circuit tester, Orbotech AOI
system, Goepel "OptiCon" AOI system and MYDATA chip shooter. The ability to import test coverage from test equipment used on the production line is a key factor in controlling the quality of the final product: lack of coverage + duplicated test = huge opportunity for cost savings. ASTER provides a comprehensive list of test coverage loaders within the
TestWay portfolio from the leading test and inspection equipment vendors within
the industry, such as Agilent [SJ10, SJ50, 5DX, i3070] , Teradyne [Spectrum, Z1800],
GenRad [GR228X], IFR/AEROFLEX [IFR4200], TRI [TR8001], Takaya Corp [APT8000, APT9000], Spea [SPEA4040],
Viscom, Orbotech, VI Technology, Mydata, Asset, Corelis, Goepel [OPTICON, CASCON], JTAG Technologies.
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| Testforce appointed as distributors for ASTER products within Canada | ||
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“We are extremely pleased to be working closely with Testforce because they have an excellent track record of sales, service and support in the Canadian test industry. There are a significant number of complex products being developed by Canadian companies that we believe will benefit enormously from using the ASTER suite of tools for maximizing design for test and improving product quality from design through to production, resulting in improved product yield” said Pete Collins, sales and marketing manager for ASTER Technologies. |
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| ASTER presents "board test coverage analysis" paper at the 2008 Aerospace Testing Seminar in USA | ||
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Peter Collins, Sales & Marketing manager of ASTER Technologies
was invited to present a technical paper on Board Test Coverage Analysis
at the recent Aerospace Testing Seminar held at Manhattan Beach in California,
USA between the 8th & 10th April.The paper entitled "Is a board 'good' because the test passes?" describes how the PPVS test coverage model can be used to calculate board level coverage at each stage in the product life cycle based on the DMPSF methodology. Peter Collins said, “We see real benefits in being able to predict test coverage at each stage in the product life cycle, because in many situations, optimal test coverage is not achievable through structural testing alone, it is important that design testability is validated by design rules checking and that functional test coverage is also considered in the analysis. |
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| New "QuadView" feature allows users to visualize shop floor Test or Assembly instructions interactively within layout and schematic views | ||
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QuadView
now has the capability to interact with shop floor documentation. The Test or Assembly instructions are designed using Microsoft Word and converted into HTML format (using a simple "Save as..."). The instructions become fully interactive with either layout or schematic views to assist in the assembly
and test of products. The HTML instructions may include hotlinks, tables, graphics, pictures, video, audio comments...Christophe LOTZ, Product Director of ASTER Technologies said, "We see this as a significant benefit to users of QuadView, particularly within a manufacturing environment to simplify manual processes by visualizing for example, the position of components within the layout view to assist with the location of barcode labels, switch/jumper settings and manual insertions etc, in conjunction with shop floor assembly and functional test instructions." |
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| Accelonix appointed as distributors for QUAD within UK and Central Europe | ||
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"We are extremely pleased to be expanding the portfolio of ASTER
products distributed by Accelonix because Accelonix has an excellent track record of sales, service and support in the
UK and Central European test industry. Accelonix is perfectly placed to add 'QUAD' to
his portfolio of complementary
PCB assembly and test products" said Christophe Lotz, Product director for ASTER Technologies. |
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| Visit ASTER during the new National Electronics Week show in London, June 17th - 19th | ||
ASTER Technologies will be exhibiting at the
new National Electronics Week show at Earls Court
in London, during June 17th to 19th, 2008. Why not come and visit us at the
Accelonix stand in Earls Court - Hall 2, Stand D60 and discuss
any requirements or interest you may have relating to Electrical DfT analysis, Test Coverage analysis,
our Next Generation Viewers or Quality Management Tools. |
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| For more information on any of the topics contained in this issue of the ASTER Technologies newsletter, please contact ASTER using the contact details listed below. |
| Corporate Headquarters ASTER Technologies 55 bis rue de Rennes 35510 CESSON SEVIGNE FRANCE Phone: +33 (0)2 99 83 01 01 Fax: +33 (0)2 99 83 01 00 E-mail: sales@aster-technologies.com |
United Kingdom ASTER Technologies Ltd. PO Box 327 Tarporley Cheshire, CW6 9WD Phone: +44 (0)1829 261557 Mob: +44 (0)7711 927840 E-mail: sales-uk@aster-technologies.com |