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A selection of our customers:
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Latest news:
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14-SEP-2010 to 16-SEP-2010:
BTW2010 - IEEE 9th Board Test Workshop - Agilent Technologies and ASTER are presenting a paper. Test Coverage Consultant - A coverage tool to explore the question:"What does it mean when the board test passes?" (Fort Collins, Colorado, USA)
 05-OCT-2010:
GOEPEL Technology Day - Learn about the new "TestWay Express" test coverage analysis tool from ASTER. You can still register online before or during the workshop. (Uttoxeter Racecourse, United Kingdom)
10-AUG-2010:
ASTER renews the partnership with Mentor Graphics OpenDoor.
19-OCT-2009:
PARIS Porte de Versailles Pavillon 7.1
10-NOV-2009 to 13-NOV-2009:
Productronica - Hall A1 stand 232 (Munich, Germany)
13-OCT-2009:
GOEPEL Technology Day - Register to learn how "TestWay" can reduce your board test and manufacturing costs (Southampton, United Kingdom)
06-OCT-2009 to 08-OCT-2009:
Forum de l'Electronique - Hall 1 stand C 57. Free subscription (Paris-Nord Villepinte, France)
23-JUN-2009:
Newsletter: Get a FREE test coverage analysis!
29-MAR-2009 to 02-APR-2009:
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms. Press release. Visit us at IPC APEX Expo, booth #1245. (California, USA)
03 & 05-MAR-2009:
Goepel Technology Days - Visit ASTER during the seminars in the UK. At Cambridge on the 3rd of March, and at Bristol on the 5th of March, 2009.
05-DEC-2008:
Newsletter: ASTER launches "low-cost" coverage analysis
20-NOV-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
11-NOV-2008 to 14-NOV-2008:
Electronica - Hall A1 - Stand 549. (Munich, Germany)
24-OCT-2008:
ASTER Technologies introduces a new generation of "easy to use" test coverage analysis tools. Press release
30-SEP-2008 to 02-OCT-2008:
Forum de l'Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
26-MAY-2008:
May release of the ASTER Newsletter.
19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
02-MAY-2007:
May release of the ASTER Newsletter.
28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
14-SEP-2006:
Functional Board Test - Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
>> More...
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WildScan: Boundary-Scan test migration with ICT
WildScan Overview
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WildScan enables migration of Boundary-Scan
test (BST) program to In-Circuit testers (ICT) without the need for
complementary hardware integration within the target In-Circuit testers. This
significantly reduces test fixturing costs by utilizing the same test fixture
for both Boundary-Scan and In-circuit testing, providing a one-stop test
solution.
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WildScan analyzes the following test sequences:
- Infrastructure test.
- Interconnections test.
- Cluster tests.
- In-system configuration of EPLD and the FPGA devices (excluding components that
require specific programming algorithms or data pulling, ie: FLASH EPROM).
A complete set of test sequences that include Boundary-Scan test bus
(TDI, TDO, TCK, TMS) test vectors and parallel I/O channels test vectors
are created.
The quality of GO/NOGO testing is maintained during conversion and the BST
diagnostics are transferred as an integrated part of the In-Circuit Test
program, or using the WildScan diagnosis capability.
Combined Boundary-Scan & ICT test strategies
Within a PCB production line that utilises In-Circuit test (ICT) and
Boundary-Scan test (BST) as the main production test strategy, a number of
combined test strategy options are possible, such as:
- Complete production test using two test stages on two independent testers.
With this solution the boards must at first be declared PASS on the ICT tester,
prior to being convoyed to the BST tester. This solution
requires two test fixtures (at additional expense), increases the production test time and is more
difficult to handle for high volume production.
- One Step Test using two test systems integrated within the same platform.
With this solution the BST tester is integrated within the ICT
tester. This hardware and most probably software integration, requires a
minimum of co-operation between the suppliers of BST and ICT testers.
- One step test on ICT test system. Taking into account the cost
of a BST tester and assuming that ICT testers resources are at least
equivalent regarding the performances requested, WildScan is innovative
solution for providing a one step test without the need for additional
proprietary hardware.
Key product benefits
Simple software translation
Migration is provided by a simple software translation without the need for
any additional proprietary hardware to be integrated within the In-circuit tester.
WildScan converts Boundary-Scan parallel accesses into standard In-Circuit Channels.
Specific migration packages provided on request
The product portfolio currently consists of a Goepel translator, but additional
translators for other Boundary-Scan platforms, such as ASSET and JTAG Technologies
can be developed on request.
Specific file generation
Specific tester files have been developed for the following In-circuit testers; Agilent,
GenRad, IFR, Rhode & Schwarz, Schlumberger and Teradyne.
Industry Standard file generation
Industry Standard file formats are supported such as; EDIF 2.0 netlist, BSDL model,
JEDEC Wave and Serial Vector Format (SVF).
Multi-platform support
The WildScan migration software will operate on multiple platforms such as; PC, Sun/Sparc
and Solaris
Tell me more
Other products
- TPQR, Test Program Quality Report
- TestWay, Board testability analyzer
- QuadView, Next generation viewers
- Quad, Quality advisor and manager
- QuadFeederSafe, make your feeder settings secure
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