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14-SEP-2010 to 16-SEP-2010:
BTW2010 - IEEE 9th Board Test Workshop - Agilent Technologies and ASTER are presenting a paper. Test Coverage Consultant - A coverage tool to explore the question:"What does it mean when the board test passes?" (Fort Collins, Colorado, USA)
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05-OCT-2010:
GOEPEL Technology Day - Learn about the new "TestWay Express" test coverage analysis tool from ASTER. You can still register online before or during the workshop. (Uttoxeter Racecourse, United Kingdom)
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10-AUG-2010:
ASTER renews the partnership with Mentor Graphics OpenDoor.
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19-OCT-2009:
PARIS Porte de Versailles Pavillon 7.1
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10-NOV-2009 to 13-NOV-2009:
Productronica - Hall A1 stand 232 (Munich, Germany)
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13-OCT-2009:
GOEPEL Technology Day - Register to learn how "TestWay" can reduce your board test and manufacturing costs (Southampton, United Kingdom)
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06-OCT-2009 to 08-OCT-2009:
Forum de l'Electronique - Hall 1 stand C 57. Free subscription (Paris-Nord Villepinte, France)
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23-JUN-2009:
Newsletter: Get a FREE test coverage analysis!
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29-MAR-2009 to 02-APR-2009:
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms. Press release. Visit us at IPC APEX Expo, booth #1245. (California, USA)
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03 & 05-MAR-2009:
Goepel Technology Days - Visit ASTER during the seminars in the UK. At Cambridge on the 3rd of March, and at Bristol on the 5th of March, 2009.
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05-DEC-2008:
Newsletter: ASTER launches "low-cost" coverage analysis
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20-NOV-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
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11-NOV-2008 to 14-NOV-2008:
Electronica - Hall A1 - Stand 549. (Munich, Germany)
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24-OCT-2008:
ASTER Technologies introduces a new generation of "easy to use" test coverage analysis tools. Press release
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30-SEP-2008 to 02-OCT-2008:
Forum de l'Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
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09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
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10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
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17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
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10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
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26-MAY-2008:
May release of the ASTER Newsletter.
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19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
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08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
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28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
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19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
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13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
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25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
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22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
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15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
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15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
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02-MAY-2007:
May release of the ASTER Newsletter.
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28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
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28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
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08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
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23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
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16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
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14-SEP-2006:
Functional Board Test - Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
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19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
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03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
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TPQR: Test Program Quality Report


ASTER Technologies the leading supplier in Board-Level Testability and Test Coverage analysis tools, introduces a new generation of “easy-to-use” test coverage analysis tools.

TPQR [Test Program Quality Report] is powered by TestWay, the world-wide reference coverage analysis tool, helping users to quantify and qualify the test coverage for a wide range of inspection and test equipments.
TPQR
Download Now TPQR Brochure
TPQR Brochure 

Test Report for Takaya flying prober

This product has been developed to address the many challenges that developers face today, such as: shrinking release cycles, budget compression and improvement in product quality. More specifically, at a time when customers expect to buy "good boards only", it becomes mandatory to understand the ability of a test to catch defects.
In other words, "how good is the test coverage?"

With this in mind, this new generation of products has been designed for use by electronic board manufacturers (CMs) and their customers, the original equipment manufacturers (OEMs), for providing precise, detailed and impartial test coverage metrics.

QuadView-TPQR is a "low-cost" test coverage analysis tool. It allows users to compute the test coverage by importing the test program or test report from a wide range or test/inspection machines used within the industry. It generates detailed HTML and MS-EXCEL reports for each individual test stage, but also consolidates the coverage for the complete production line.

TPQR checks the ability of each measurement/inspection test to catch certain defect types based on component type, value, tolerance, board connectivity, component location, shape, pitch etc. It is built around QuadView, the suite of next generation viewers for the Electronics Industry. Utilizing this powerful layout and schematic viewer, it allows users to visualize coverage at both device and pin level.

It supports more than 35 test models including AOI, AXI, BST, FPT, ICT, and MDA, as well as a wide range of test/inspection machines used within the industry such as:

Acculogic: ScanNavigator, Scorpion, Sprint; Aeroflex: 42xx; Agilent Technologies: i3070, 5DX, SJ10, SJ50; Asset; Corelis; Dr. Eschke: CR350; Flynn Systems: onTAP; Goepel: CASCON, OPTICON; JTAG Technologies; MIRTEC: MV Series; MYDATA; OMRON; Orbotech: S22, TRION, VT9300; SAKI; SEICA: VIVA; SPEA: 3030, 4040; Takaya: APT8xxx, APT9xxx; Teradyne: Z1800, Spectrum, GR228x, TS124, TS128; TRI: TR7500, TR8001; VISCOM; VI-Technology: Vi Series; XJTAG and YESTech.

Key Product benefits

TPQR Concept

Ease of Use

Visualize the test coverage provided by the test and inspection equipment, by simply importing the test program.

Scalable-License migration

Convert the TPQR configuration into TestWay, enabling more sophisticated analysis capabilities.

Wide range of test & inspection

Import test program or test report from a wide range of test & inspection systems such as Acculogic: ScanNavigator, Scorpion, Sprint; Aeroflex: 42xx; Agilent Technologies: i3070, 5DX, SJ10, SJ50; Asset; Corelis; Dr. Eschke: CR350; Flynn Systems: onTAP; Goepel: CASCON, OPTICON; JTAG Technologies; MIRTEC: MV Series; MYDATA; OMRON; Orbotech: S22, TRION, VT9300; SAKI; SEICA: VIVA; SPEA: 3030, 4040; Takaya: APT8xxx, APT9xxx; Teradyne: Z1800, Spectrum, GR228x, TS124, TS128; TRI: TR7500, TR8001; VISCOM; VI-Technology: Vi Series; XJTAG and YESTech.

Coverage Analysis

Powered by TestWay, the world-wide reference coverage tool, helping users to quantify and qualify test coverage. It is designed for use by board manufacturers (CMs) and their customers (OEMs), for providing precise, detailed, and impartial test coverage metrics such as PPVS or PCOLA/SOQ.

Full CAD support

The projects used for test program generation within FabMaster, TestExpert or CAMCAD are imported by TPQR in order to modelize & visualize board layout. Alternatively, a wide range of layout format could be imported such as Cadence, CADIF, GenCad, GenCam, Mentor Neutral, ODB++, Orcad, Pads, Protel, Zuken…

Comprehensive Reports

Create HTML reports for test coverage, presented as a board level overview, or as explicit coverage information on selected items. The reports have been designed to be navigated by a simple Internet browser. Users can share advanced and standardized interactive reports throughout design & test organizations.

MS-Excel spreadsheet

Excel report indicates the ability to detect device Presence, Polarity, Value and Solder defects for each part.

Color assignment

Visualize test coverage on components and pins using the "traffic lights" color coding:

Green = Well tested ;
Orange = Partially tested ;
Red = Not tested.

Fully Interactive Cross-probing

Enable fully interactive cross-probing between test coverage reports and board view.

Takaya Boundary-Scan optimizer

Optimize existing TAKAYA test programs by removing redundant test steps when the Takaya is combined with Boundary-Scan test equipment such as that provided by: ACCULOGIC, ASSET, CORELIS, Flynn, GOEPEL, JTAG Technologies or XJTAG.

 

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