A selection of our customers:

ASTER's satisfied customers


Latest news:

14-SEP-2010 to 16-SEP-2010:
BTW2010 - IEEE 9th Board Test Workshop - Agilent Technologies and ASTER are presenting a paper. Test Coverage Consultant - A coverage tool to explore the question:"What does it mean when the board test passes?" (Fort Collins, Colorado, USA)
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05-OCT-2010:
GOEPEL Technology Day - Learn about the new "TestWay Express" test coverage analysis tool from ASTER. You can still register online before or during the workshop. (Uttoxeter Racecourse, United Kingdom)
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10-AUG-2010:
ASTER renews the partnership with Mentor Graphics OpenDoor.
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19-OCT-2009:
PARIS Porte de Versailles Pavillon 7.1
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10-NOV-2009 to 13-NOV-2009:
Productronica - Hall A1 stand 232 (Munich, Germany)
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13-OCT-2009:
GOEPEL Technology Day - Register to learn how "TestWay" can reduce your board test and manufacturing costs (Southampton, United Kingdom)
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06-OCT-2009 to 08-OCT-2009:
Forum de l'Electronique - Hall 1 stand C 57. Free subscription (Paris-Nord Villepinte, France)
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23-JUN-2009:
Newsletter: Get a FREE test coverage analysis!
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29-MAR-2009 to 02-APR-2009:
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms. Press release. Visit us at IPC APEX Expo, booth #1245. (California, USA)
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03 & 05-MAR-2009:
Goepel Technology Days - Visit ASTER during the seminars in the UK. At Cambridge on the 3rd of March, and at Bristol on the 5th of March, 2009.
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05-DEC-2008:
Newsletter: ASTER launches "low-cost" coverage analysis
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20-NOV-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
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11-NOV-2008 to 14-NOV-2008:
Electronica - Hall A1 - Stand 549. (Munich, Germany)
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24-OCT-2008:
ASTER Technologies introduces a new generation of "easy to use" test coverage analysis tools. Press release
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30-SEP-2008 to 02-OCT-2008:
Forum de l'Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
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09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
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10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
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17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
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10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
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26-MAY-2008:
May release of the ASTER Newsletter.
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19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
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08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
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28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
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19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
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13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
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25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
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22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
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15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
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15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
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02-MAY-2007:
May release of the ASTER Newsletter.
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28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
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28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
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08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
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23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
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16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
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14-SEP-2006:
Functional Board Test - Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
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19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
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03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
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Testability analysis

Using TestWay, ASTER provides advanced Testability report:

  • Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test.
  • Test point optimization - Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
  • Test balancing.
  • Test coverage prediction and measurement.
  • Production yield prediction - Defect opportunities.
  • Boundary-Scan test program generation.
  • Flying Probe Test program optimization.
    Adobe Acrobat The powerful combination of flying probe test and JTAG test speeds up testing (PDF file, 190k)

Additional information



 
     
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