A selection of our customers:

ASTER's satisfied customers


Latest news:

30-SEP-2009 to 02-OCT-2009:
Forum de l’Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
separator
09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)

en-AutoTestCon2008

separator
10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
separator
01-JUL-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
separator
17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
separator
10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
separator
26-MAY-2008:
Last release of the ASTER Newsletter.
separator
19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
separator
08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
separator
28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
separator
19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
separator
13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
separator
25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
separator
22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
separator
15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
separator
15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
separator
02-MAY-2007:
May release of the ASTER Newsletter.
separator
28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
separator
28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
separator
08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
separator
23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
separator
14-NOV-2006 to 17-NOV-2006:
Electronica - Stand A1-548 (Munich, Germany)
separator
16-OCT-2006 to 18-OCT-2006:
Electronics Forum - Stand J80 (Paris, France)
separator
16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
separator
04-OCT-2006 & 05-OCT-2006:
French ASTER User's Group 2006 - (Rennes, France)
separator
14-SEP-2006:
Functional Board Test – Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
separator
19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
separator
03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
separator
08-FEB-2006 to 10-FEB-2006:
APEX - Booth #1583 (Anaheim Convention Center, USA)
separator
18-JAN-2006 to 20-JAN-2006:
23th ElectroTest Japan - Booth 27-9 (Tokyo Big Sight, Japan)
separator
25-OCT-2004 to 28-OCT-2004:
ITC 2004 - International Test Conferencing (IEEE). (Charlotte, USA)
separator
>> More...
  Products   Services   Events   Company
Contact us   ASTER Worldwide locations Worldwide locations
Choose your
language:
English version  Version française  
 
Solutions Provider for PCB Test and manufacturing - ASTER Technologies

Welcome to ASTER Technologies

Company Profile

ASTER Headquarters ASTER Technologies is the leading supplier in Board-Level Testability analysis tools, which capitalizes on proven expertise in board testability and strong customer relations. Founded in 1993, ASTER develops a wide range of products dealing with PCB Testability, Viewing and Quality Management.

Our skilled employees constantly develop and enhance a suite of complementary products while our global network of specialists support our installed base worldwide, including independent support centers, distributors and value added resellers.

We take pride in possessing an in-depth understanding of customers' requirements and the expertise to create innovative solutions in electronics and software engineering. Our philosophy can be summarized in one sentence: "If there is no solution, it is because there is no problem."

Main Products

ASTER Technologies portfolio of electrical Testability Analysis, Board Viewing and Quality Management products have been developed over many years by working closely with our customers in fully understanding their problems and providing innovative solutions, to improve product yield from design through to production.

Improving yield management requires a deep insight into all quality aspects of electronics production. This is achieved through comprehensive electrical DfT analysis early in the design cycle, leading to efficient test distribution and fault coverage verification, whilst incorporating pro-active defect prevention; resulting in higher product reliability, ensuring that faulty products are not delivered to the customer, resulting in increased competitiveness and profitability.

TestWay TestWay is a proven solution, used by many PCB design and manufacturers worldwide that provides a unique approach to analyze electrical testability requirements and  estimate test coverage aligned to specific test strategies, at the earliest opportunity in the design cycle. The TestWay open architecture design is based on a testability framework that interfaces with a variety of plug-in modules to provide both import and export opportunities that make it fully customizable to customer's specific requirements.
QuadView QuadView is a powerful set of scalable board viewing modules that can be used either as a standalone viewer or fully integrated within customer's applications. QuadView can be used in the design environment to assist in DfT and test coverage analysis. Whereas, within the manufacturing environment it becomes an integral part of the repair cycle, assisting in locating faults and reducing repair time significantly.
Quad QUAD is a flexible modular Quality Management tool built around a centralized and open architecture database, providing traceability for any PCB electronic production data. QUAD covers all quality aspects of PCB assembly, sub-assembly and system build, allowing you to manage the quality data flow from product realization to product retirement. It has been designed to be used either standalone or to be easily integrated into any existing production environment.
WildScan WildScan is a product that makes it possible to migrate a Boundary-Scan test (BST) program to an In-Circuit tester (ICT) without the need for any complementary hardware integration within the In-Circuit tester. This significantly reduces test fixturing costs by utilising the same test fixture for both Boundary-Scan and In-Circuit testing, providing a one-stop test solution.

Recent activity

Publications
Upcoming events
  • Forum de l’Electronique, 30-SEP-2009 to 02-OCT-2009, Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
  • Autotestcon, 09-SEP-2008 to 11-SEP-2008, Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
  • National Electronics Week, 17-JUN-2008 to 19-JUN-2008, Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
  • First ASTER Chinese Users' Group, 10-JUN-2008, Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
  • Productronica, 13-NOV-2007 to 16-NOV-2007, Hall A1 - Stand 452 (Munich, Germany)
  • Electronics Forum, 25-SEP-2007 to 27-SEP-2007, Hall 7.2 - Stand R98 (Paris, France)
  • Nepcon UK, 15-MAY-2007 to 17-MAY-2007, Stand G46 (Birmingham NEC, United Kingdom)
  • Boundary Scan Day, 28-FEB-2007, organised by GOEPEL Electronic (Cambridge University, United Kingdom)
  • Test In Production Event, 08-FEB-2007, organised by ACCELONIX, NL (Eindhoven, The Netherlands)
  • Electronica, 14-NOV-2006 to 17-NOV-2006, Stand A1-548 (Munich, Germany)
  • Electronics Forum, 16-OCT-2006 to 18-OCT-2006, Stand J80 (Paris, France)
  • French ASTER User's Group 2006, 04-OCT-2006 & 05-OCT-2006, (Rennes, France)
  • APEX, 08-FEB-2006 to 10-FEB-2006, Booth #1583 (Anaheim Convention Center, USA)
  • 23th ElectroTest Japan, 18-JAN-2006 to 20-JAN-2006, Booth 27-9 (Tokyo Big Sight, Japan)
  • ITC 2004, 25-OCT-2004 to 28-OCT-2004, International Test Conferencing (IEEE). (Charlotte, USA)


 
     
Home | News & Events | Products | Services | Contact us | Terms of use | Privacy policy © 1993-2008 Aster All Rights Reserved.
Aster - Solutions Provider for PCB Test, improving your yields from design to production.