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A selection of our customers:
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Latest news:
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30-SEP-2009 to 02-OCT-2009:
Forum de l’Electronique - Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
 09-SEP-2008 to 11-SEP-2008:
Autotestcon - Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
10-JUL-2008:
Success Stories : KONTRON Testimonial. (Boisbriand, Canada)
01-JUL-2008:
ASTER renews the partnership with Mentor Graphics OpenDoor.
17-JUN-2008 to 19-JUN-2008:
National Electronics Week - Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
10-JUN-2008:
First ASTER Chinese Users' Group - Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
26-MAY-2008:
Last release of the ASTER Newsletter.
19-MAY-2008:
Accelonix appointed as the official distributor for QUAD, within the UK and Central Europe.
08-APR-2008 to 10-APR-2008:
"Is a board 'good' because the test passes?", technical paper on Board Test Coverage Analysis presented at the Aerospace Testing Seminar 2008. (California, USA)
28-FEB-2008:
Publication of the article Quad - Une solution dédiée rationalise le contrôle de la qualité des cartes in the french magazine 'Electronique International'. (France)
19-FEB-2008:
ASTER appoints Testforce as Distributor in Canada. (Toronto, Canada)
13-NOV-2007 to 16-NOV-2007:
Productronica - Hall A1 - Stand 452 (Munich, Germany)
25-SEP-2007 to 27-SEP-2007:
Electronics Forum - Hall 7.2 - Stand R98 (Paris, France)
22-JUN-2007:
ASTER Technologies benefit from Microsoft Empower to develop QuadView.
15-MAY-2007 to 17-MAY-2007:
Nepcon UK - Stand G46 (Birmingham NEC, United Kingdom)
15-MAY-2007:
ASTER and GOEPEL announce a collaboration for CASCON ScanVision III development.
02-MAY-2007:
May release of the ASTER Newsletter.
28-FEB-2007:
Boundary Scan Day - organised by GOEPEL Electronic (Cambridge University, United Kingdom)
28-FEB-2007:
ASTER and GOEPEL announce DfT Rules Checking collaboration
08-FEB-2007:
Test In Production Event - organised by ACCELONIX, NL (Eindhoven, The Netherlands)
23-JAN-2007:
Read article on "Are your board designs testable?" published on the EngineerLive website.
14-NOV-2006 to 17-NOV-2006:
Electronica - Stand A1-548 (Munich, Germany)
16-OCT-2006 to 18-OCT-2006:
Electronics Forum - Stand J80 (Paris, France)
16-OCT-2006:
ASTER Technologies and TEMENTO Systems announce a strategic partnership
04-OCT-2006 & 05-OCT-2006:
French ASTER User's Group 2006 - (Rennes, France)
14-SEP-2006:
Functional Board Test – Defect Coverage Analysis, at the 5th IEEE Board Test Workshop. (Fort Collins, Colorado, USA)
19-JUN-2006:
ASTER appoints RDT as Distributor in Israel. (Tel Aviv, Israel)
03-APR-2006:
ASTER opens Direct sales and support Office in the UK. ASTER Technologies Ltd is managed by Peter COLLINS who becomes the sales and marketing manager.
08-FEB-2006 to 10-FEB-2006:
APEX - Booth #1583 (Anaheim Convention Center, USA)
18-JAN-2006 to 20-JAN-2006:
23th ElectroTest Japan - Booth 27-9 (Tokyo Big Sight, Japan)
25-OCT-2004 to 28-OCT-2004:
ITC 2004 - International Test Conferencing (IEEE). (Charlotte, USA)
>> More...
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Solutions Provider for PCB Test and manufacturing - ASTER Technologies
Welcome to ASTER Technologies
Company Profile
ASTER Technologies is the leading supplier in Board-Level Testability analysis tools,
which capitalizes on proven expertise in board testability and strong
customer relations. Founded in 1993, ASTER develops a wide range of
products dealing with PCB Testability, Viewing and Quality Management.
Our skilled employees constantly develop and enhance a suite of complementary products while our
global network of specialists support our installed base worldwide,
including independent support centers, distributors and value added resellers.
We take pride in possessing an in-depth understanding of customers'
requirements and the expertise to create innovative solutions in
electronics and software engineering. Our philosophy can be summarized
in one sentence: "If there is no solution, it is because there is no
problem."
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Main Products
ASTER Technologies portfolio
of electrical Testability Analysis, Board Viewing and Quality Management
products have been developed over many years by working closely with our
customers in fully understanding their problems and providing innovative
solutions, to improve product yield from design through to production.
Improving yield management requires a deep insight into all
quality aspects of electronics production. This is achieved through
comprehensive electrical DfT analysis early in the design cycle, leading to
efficient test distribution and fault coverage verification, whilst
incorporating pro-active defect prevention; resulting in higher product
reliability, ensuring that
faulty products are not delivered to the customer, resulting in increased
competitiveness and profitability.
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TestWay is
a proven solution, used by many PCB design and manufacturers worldwide that
provides a unique approach to analyze electrical testability requirements
and estimate test coverage aligned to specific test strategies, at the
earliest opportunity in the design cycle.
The TestWay open architecture design is based on a testability framework
that interfaces with a variety of plug-in modules to provide both import and
export opportunities that make it fully customizable to customer's specific
requirements. |
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QuadView is a powerful set of
scalable board viewing modules that can be used either as a standalone
viewer or fully integrated within customer's applications.
QuadView can be used in the design environment to assist in DfT and test
coverage analysis. Whereas, within the manufacturing environment it becomes an
integral part of the repair cycle, assisting in locating faults and
reducing repair time significantly.
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QUAD is a flexible
modular Quality Management tool built around a centralized and open
architecture database, providing traceability for any PCB electronic
production data. QUAD covers all quality aspects of PCB assembly,
sub-assembly and system build, allowing you to manage the quality data
flow from product realization to product retirement. It has been
designed to be used either standalone or to be easily integrated into
any existing production environment. |
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WildScan is a product that
makes it possible to migrate a Boundary-Scan test (BST) program to an
In-Circuit tester (ICT) without the need for any complementary hardware
integration within the In-Circuit tester. This significantly reduces
test fixturing costs by utilising the same test fixture for both
Boundary-Scan and In-Circuit testing, providing a one-stop test
solution. |
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Recent activity
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| Upcoming events |
- Forum de l’Electronique, 30-SEP-2009 to 02-OCT-2009, Hall 2 Stand 2-N100. (Paris-Nord Villepinte, France)
- Autotestcon, 09-SEP-2008 to 11-SEP-2008, Visit ASTER at the Global Test Solutions booth, stand 930. Information & registration (Salt Lake City, USA)
- National Electronics Week, 17-JUN-2008 to 19-JUN-2008, Visit ASTER at the Accelonix booth, Hall 2, Stand D60. (London, United Kingdom)
- First ASTER Chinese Users' Group, 10-JUN-2008, Visit us and share users experience and stay informed about the upcoming products development. English version - Chinese version (Shanghai, China)
- Productronica, 13-NOV-2007 to 16-NOV-2007, Hall A1 - Stand 452 (Munich, Germany)
- Electronics Forum, 25-SEP-2007 to 27-SEP-2007, Hall 7.2 - Stand R98 (Paris, France)
- Nepcon UK, 15-MAY-2007 to 17-MAY-2007, Stand G46 (Birmingham NEC, United Kingdom)
- Boundary Scan Day, 28-FEB-2007, organised by GOEPEL Electronic (Cambridge University, United Kingdom)
- Test In Production Event, 08-FEB-2007, organised by ACCELONIX, NL (Eindhoven, The Netherlands)
- Electronica, 14-NOV-2006 to 17-NOV-2006, Stand A1-548 (Munich, Germany)
- Electronics Forum, 16-OCT-2006 to 18-OCT-2006, Stand J80 (Paris, France)
- French ASTER User's Group 2006, 04-OCT-2006 & 05-OCT-2006, (Rennes, France)
- APEX, 08-FEB-2006 to 10-FEB-2006, Booth #1583 (Anaheim Convention Center, USA)
- 23th ElectroTest Japan, 18-JAN-2006 to 20-JAN-2006, Booth 27-9 (Tokyo Big Sight, Japan)
- ITC 2004, 25-OCT-2004 to 28-OCT-2004, International Test Conferencing (IEEE). (Charlotte, USA)
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